Reducing Test Time Over Product Lifecycle


Test Time

Reducing Test Time Over Product Lifecycle

 

P07C2-12 :

In the manufacturing of high complexity electronics, long hours of testing are typically required to ensure adherence to published specifications. The project is modelled as job shop scheduling problem where each test operation is evaluated and optimized to speed up the test time. A tacit knowledge acquisition approach with inconsistency detection is developed to support the optimized schedule. Embedding the algorithms into a machine learning framework makes it possible to detect common patterns then eliminate the bottlenecks, leading to cost saving and faster manufacturing throughput.


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